WP3 - Spectral Interferometers for Multi-property Measurement

THEME ONE

The aim of this WP is to explore spectral interferometry as the basis for creating novel sensors operating at both long-scales (metres) and nano-scales. For absolute distance, vibration and surface topography measurement at the long-scale, the key targets are rapid coordinate measurement with low system cost. At the nano-scale, the challenge is to produce an ultra-miniature sensor-on-a-chip for absolute distance, surface profile and layer thickness measurement. This WP contributes to the aim to support embedded metrology ‘cross-scale’ in high-value manufacturing by aligning Theme I, Objectives 2 & 4.

   

Publications

Martin, H., Kumar, P., Henning, A. and Jiang, X. “Extended sub-surface imaging in industrial OCT using ‘non-diffracting’ Bessel beams,” CIRP Annals Manuf. Tech. (accepted for publication), 2020. (Q1).

Furness T., Williamson, J., Fletcher, S., Iqbal, A., Henning, A., Martin, H., Jiang, X., Bertarelli, A., Carra, F. and Pasquali, M. “In-Situ Displacement Measurement for use in LHC Collimators,” EUSPEN 2020. 

Henning, A., Williamson, J., Martin, H., & Jiang, X. (2019). Improvements to dispersed reference interferometry: beyond the linear approximation. Applied Optics, 58(1), 131-136. (Q1). 

Tang, D., Henning, A.J., Gao, F., Gribble, A.P. and Jiang, X "Improved description of the signal formation in grating generated-optical coherence tomography," Opt. Express 27, 33999-34010 (2019). (Q1). 

Jiang, X., Gao, F., Martin, H., Williamson J. and Li, D. Chapter 7, On-machine metrology, Hybrid Machining, edited by Xichun Luo and Yi Qin, 1st Ed. Academic Press (Elsevier), 2018; eBook ISBN: 9780128131138; Paperback ISBN: 9780128130599.