Research
Platform Programme One – Next Generation Surface Metrology
Platform Programme One aims to build a Basis for Future Standardised Freeform/Structured Surface Characterisation System. This research focuses on creating universal evaluation systems for freeform and structured surfaces, which include refining the discrete/continuous non-Euclidean surface representations, sampling, filtration, characterisation, fast algorithms and practical approaches.
Platform Programme One aims to build a Basis for Future Standardised Freeform/Structured Surface Characterisation System. This research focuses on creating universal evaluation systems for freeform and structured surfaces, which include refining the discrete/continuous non-Euclidean surface representations, sampling, filtration, characterisation, fast algorithms and practical approaches.
| Platform Programme One | Platform Programme Two | Platform Programme Three | Platform Programme Four |
|---|---|---|---|
| Next-Generation Surface Metrology | Metrology Technologies and Applications | In-Process Metrology | Machine Tool and Large Volume Metrology |
We have established a unique and sustainable research hub to develop world-class science and deliver significant and lasting economic impact. The current hub grand challenge research is focussed on two research themes:
THEME ONE - Embedded Metrology Foundations
Embedded Metrology will build sound technological foundations by bridging four formidable gaps in process- and component-embedded metrology.
This covers: physical limits on the depth of field; high dynamic range measurement; real-time dynamic data acquisition in optical sensor/instruments; and robust, adaptive, scalable models for real-time control.
This covers: physical limits on the depth of field; high dynamic range measurement; real-time dynamic data acquisition in optical sensor/instruments; and robust, adaptive, scalable models for real-time control.
For more information and to meet the teams involved in these projects click on the links below:
| Work Package 1 | Work Package 2 | Work Package 3 | Work Package 4 |
|---|---|---|---|
| WP1 Basic Non-diffractive Interferometry | WP2 Novel Fringe Projection Technologies Across Scales | WP3 Spectral Interferometers for Multi-property Measurement | WP4 Metrology-driven Control for Manufacturing Systems |
THEME TWO - Metrology Data Analytics
Metrology Data analytics will create a smart knowledge system to unify metrology language, understanding, and usage between design, production and verification for geometrical products manufacturing; Establishment of data analytics systems to extract maximal information from measurement data going beyond state-of-the-art for optimisation of the manufacturing process to include system validation and product monitoring. systems using sensor networks with different physical properties under time-discontinuous conditions.
For more information and to meet the teams involved in these projects click on the links below:
| Work Package 5 | Work Package 6 | Work Package 7 | Work Package 8 |
|---|---|---|---|
| WP5 New Mathematical Fundamentals for Sensor Net Metrology | WP6 Smart Semantic Metrology Systems | WP7 Metrology Data Analytic Models for the Manufacturing Value Chain | WP8 Metrology Approach to Artificial Intelligence Control |