THEME TWO

Metrology Data Analytics
New Mathematical Fundamentals for Sensor Net Metrology

The aim of WP5 is to develop a useable holistic approach to metrology theory and practice across the manufacturing value chain by extending metrology theory from single sensors and highly structured sensor networks to an irregularly structured network of disparate sensors types and develop a full kit of associated metrology tools. It is aligning with Theme II, Objective 5 and Objective 6.

Meet the team

Prof. Paul Scott

Investigator

University of Huddersfield

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Dr Wenhan Zeng

Investigator

University of Huddersfield

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Dame Prof. Xiangqian (Jane) Jiang

Investigator

University of Huddersfield

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Dr Qunfen Qi

Investigator

University of Huddersfield

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Publications

P. Scott “Fundaments of measurement for computationally-intensive metrology. Series on Advances in Mathematics for Applied Sciences,” 89, 119 (2018). 

Book Chapter: 
Q.Qi, P.J. Scott, X.Jiang, Chapter 12: Smart surface design and metrology platform. In: X. Jiang, P.J. Scott, Advanced Metrology: Freeform Surface, Academic Press, ISBN 978012817337, April 2020 .