News

21/05/2018
Surface Metrology Training School - June 2018
Karl Walton in the metrology lab

This year’s Surface Metrology Training School takes place on Wednesday 13th and Thursday 14th of June 2018.

Open to industrial and academic users from across the UK, the School aims to provide a broad based introduction to the theory and practice of surface metrology. Delivered by a group of experienced specialists, the School offers attendees two days of theoretical seminars and hands on sessions with market leading metrology instrumentation. Attendees will also benefit from a presentation on the future direction of surface metrology from the Hub’s renowned director, Professor Dame Xiangqian (Jane) Jiang DBE.

The development of the Surface Metrology Training School is part of the Future Metrology Hub’s strategy to support the training and development of the next generation of metrologists.

Places on the Summer School cost £550 per person, with a reduced rate for students (£250) and for the Future Metrology Hub’s industry partners (£350). Places can be booked on the University’s online store. For more details about the School please contact Dr Karl Walton: K.Walton@hud.ac.uk

The Surface Metrology Training School has been accepted by euspen as part of their wider precision engineering course program (ECP2) 


Day 1 Agenda 

09:00

 

Welcome and introduction (including evacuation procedure instructions)

09:15

Seminar

Introduction to surface measurement and considerations in surface measurement. (Dr Karl Walton)

10:15

 

Break (refreshments provided)

10:30

Seminar

“The future of surface metrology” (Professor Dame Xiangqian (Jane) Jiang DBE)

11:30

Seminar

Contacting instruments

Contact stylus and AFM instrumentation, operating principles, applications, calibration and standards.  (Dr Tukun Li and Dr Leigh Fleming)

12:30

 

Lunch (buffet lunch provided) (tour of the Hub) 13:00

13:30

Seminar

Non contacting instruments (1)

Optical surface metrology instrumentation, Phase shifting and Coherence Scanning Interferometers, operating principles, applications, calibration and standards. (Dr Haydn Martin)

15:30

 

Break (refreshments provided)

15:45

Practical

Instrument manufacturer demonstration (Bruker)

 

17:00

 

Finish

 

Day 2 Agenda 

09:00

Seminar

Non contacting instruments (2)

Optical surface metrology instrumentation, including; Focus Variation, Confocal microscopy, operating principles, applications, calibration and standards

(Dr Hussam Muhamedsalih)

10:00

Seminar

Surface texture profile parameters (ISO 4287) and Geometric Product Specification (GPS) (Dr Tukun Li)

11:00

 

Break (refreshments provided)

11:15

Seminar

Surface texture areal parameters;

Principles and applications of areal surface parameters (ISO 25178)

(Prof Liam Blunt)

12:15

 

Lunch (buffet lunch provided)

13:30

Seminar

Filtration;

Profile and areal filtration principles and applications including; robust and regression filters, Gaussian, spline and wavelet filters (Dr Wenhan Zeng)

14:30

 

Break (refreshments provided)

14:45

Practical

Instrument manufacturer demonstration (Sensofar)

17:00

 

Finish