News

12/08/2019
An excellent delivery of what is still a young conference by the team at Huddersfield
Prof Liam Blunt introduces the DXCT Conference

This was just one of the positive comments from delegates who attended the 4th Dimensional X-Ray Computed Tomography Conference hosted by the Future Metrology Hub at the University of Huddersfield.

This successful Conference was held on 25-26 June and attracted over 100 presenters, delegates and exhibitors.  In addition to the Conference, an optional, skills development training day took place on 24 June.

The dXCT Conference was launched as a one-day event by NPL’s Engineering Measurement Division in 2016 as the UK’s first international scientific conference dedicated to dimensional X-ray computed tomography.  The purpose of the conference is to present and disseminate the latest developments in the field and its industrial impact across a variety of applications and to define synergies and opportunities for collaboration between different organisations and commercial representatives.

The conference, which has now grown from one to two days, included a dinner and networking event at the Yorkshire Sculpture Park and a discussion session on BSI standardisation.  There were 26 presentations and 10 posters, with contributors from the fields of academia, medicine and industry.   The keynote speakers were: Markus Bartscher from PTB, Harry Hothi from University College London, Desi Bacheva from Hieta Technologies and Wenjuan Sun from NPL.  The prize for the best presentation went to Mason Rowbottom from the University of Huddersfield and for the best poster to Reuben Lindroos from the University of Southampton.  The exhibition featured stands from specialist companies showcasing the latest software, light technology, optics and imaging scientific equipment.

The conference received excellent feedback from the delegates with respondents appreciating the breadth of topics and speakers, the networking and knowledge exchange opportunities and the smooth organisation of the event.